Test Probe A of IEC61032

Item No.: LX-1201
Include CNAS & ILAC Calibration Certificate
E-mail: sales@iecgauges.com
Made in China
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50mm Sphere test probe A with Baffle and Handle

Specification:

IP1X Probe A /Test Probe A
1, According to: IEC 61032:1997 / IEC 60529:2001.
2, Test Probe A is necessary appliance for household and similar electrical appliance of against electric shock protection test.

Technical Parameters:

1. Ball Diameter:50 mm

2. Baffle Plate Diameter:45 mm

3. Baffle Plate Thickness: 4 mm

4. Handle Diameter:10 mm

5. Handle Length: 100 mm

6. According to IEC 61032 figure 1 (the Test probe A), table 6 IEC 60529 the first characteristics (1)

Company introduction

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

Main Products: Go No go gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 test finger, Plugs and Socket Outlet Gauge, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.

If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.

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Website: http://www.iecgauges.com